Úplná optická charakterizace neabsorbujících dvojvrstev a trojvrstev pomocí víceúhlové elipsometrie
| Title in English | Complete optical characterisation of nonabsorbing double layers and triple layers using multiple angle of incidence ellipsometry |
|---|---|
| Authors | |
| Year of publication | 1999 |
| Type | Article in Periodical |
| Magazine / Source | Jemná mechanika a optika |
| MU Faculty or unit | |
| Citation | |
| Field | Optics, masers and lasers |
| Description | In this paper the ellipsometric method enabling us to determine the values of all the optical parameters, ie. the values of the refractive indices and thicknesses, of non-absorbing double layers and triple layers placed onto absorbing substrate is described. |
| Related projects: |