Structural characterization of self-assembled Ge dot multilayers by x-ray diffraction and reflectivity methods

Warning

This publication doesn't include Institute of Computer Science. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	DARHUBER A.A. HOLÝ Václav SCHITTENHELM P. STANGL J. KEGEL I. KOVATS Z. METZGER T.H. BAUER G. ABSTREITER G. GRUEBEL G.
Year of publication	1998
Type	Article in Periodical
Magazine / Source	Physica E 2
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	multilayers by x-ray
Related projects:	Physical properties of new materials and layered structures