X-ray characterization of semiconductor surfaces and interfaces

Warning

This publication doesn't include Institute of Computer Science. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	PLOTZ W. HOLÝ Václav
Year of publication	1994
Type	Article in Periodical
Magazine / Source	J. Phys. III France 4
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Related projects:	Physical properties of new materials and layered structures