Performance of multilayer monochromators for hard X-ray imaging with coherent synchrotron radiation

Warning

This publication doesn't include Institute of Computer Science. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	DIETSCH R. RACK A. WEITKAMP T. RIOTTE M. RACK T. HOLZ T. KRÄMER M. WEISSBACH D. MORAWE C. SIEWERT F. MEDUŇA Mojmír CLOETENS P. ZIEGLER E.
Year of publication	2011
Type	Article in Proceedings
Conference	THE 10TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY
MU Faculty or unit	Faculty of Science
Citation
web	http://proceedings.aip.org/resource/2/apcpcs/1365/1/77_1?bypassSSO=1
Doi	https://doi.org/10.1063/1.3625308
Field	Solid matter physics and magnetism
Keywords	coherence; multilayer mirrors; synchrotron radiation; X-ray imaging; x-ray monochromators; x-ray optics; xray phase contrast
Description	We publish a study in which multilayers of different periodicity (from 2.5 to 5.5 nm), composition (W/Si, Mo/Si, Pd/B4C, Ru/B4C), and numbers of layers have been compared.
Related projects:	Physical and chemical properties of advanced materials and structures