Micro-imaging performance of multilayers used as monochromators for coherent hard X-ray synchrotron radiation

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Authors	RACK A. WEITKAMP T. RIOTTE M. RACK T. DIETSCH R. HOLZ T. KRÄMER M. SIEWERT F. MEDUŇA Mojmír MORAWE Ch. CLOETENS P. ZIEGLER E.
Year of publication	2010
Type	Article in Periodical
Magazine / Source	Proceedings of SPIE - The International Society for Optical Engineering
MU Faculty or unit	Faculty of Science
Citation
web	http://spiedigitallibrary.org/proceedings/resource/2/psisdg/7802/1/78020M_1?isAuthorized=no
Doi	https://doi.org/10.1117/12.858355
Field	Solid matter physics and magnetism
Keywords	Coherence; Multilayer mirrors; Synchrotron radiation; X-ray imaging; X-ray monochromators; X-ray optics; X-ray phase contrast
Description	We present a systematic study in which multilayers of different composition (W/Si, Mo/Si, Pd/B4C), periodicity (from 2.5 to 5.5 nm), and numbers of layers have been characterised.
Related projects:	Physical and chemical properties of advanced materials and structures