Modeling of optical constants of organosilicon thin films by parameterization of denstity of states
| Authors | |
|---|---|
| Year of publication | 2006 |
| Type | Article in Proceedings |
| Conference | 4th Workshop Ellipsometry |
| MU Faculty or unit | |
| Citation | |
| Field | Plasma physics |
| Keywords | optical-konstant-organosilicon-density-states |
| Description | Modeling of optical constants of organosilicon thin films by parameterization of denstity of states |
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