Influence of the atomic force microscope tip on the multifractal analysis of rough surfaces

Warning

This publication doesn't include Institute of Computer Science. It includes Faculty of Science. Official publication website can be found on muni.cz.

Authors	KLAPETEK Petr OHLÍDAL Ivan BÍLEK Jindřich
Year of publication	2004
Type	Article in Periodical
Magazine / Source	Ultramicroscopy
MU Faculty or unit	Faculty of Science
Citation
Field	Solid matter physics and magnetism
Keywords	Roughness; AFM
Description	In this paper ...
Related projects:	Realisation of thelaboratory instrument for surface roughness measurement by holographic interferometry Optical and mechanical properties of DLC : Si thin films prepared by the PECVD method